C.-C. Wu, F.-H. Ko, W.-L. Yang, H.-C. You, F.-K. Liu, C.-C. Yeh, P.-L. Liu, C.-K. Tung, C.-H. Cheng,A Robust Data Retention Characteristic of Sol-gel Derived Nanocrystal Memory by Hot Hole Trapping,IEEE Electron Device Letters,31,pp746-748 (SCI)

學年度	2010
期刊等級	SCI
論文名稱(篇名)	A Robust Data Retention Characteristic of Sol-gel Derived Nanocrystal Memory by Hot Hole Trapping
期刊名	IEEE Electron Device Letters
卷數	31
起頁	746
迄頁	748
全部作者	C.-C. Wu, F.-H. Ko, W.-L. Yang, H.-C. You, F.-K. Liu, C.-C. Yeh, P.-L. Liu, C.-K. Tung, C.-H. Cheng
使用語言	英文

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