C.-C. Wu, F.-H. Ko, W.-L. Yang, H.-C. You, F.-K. Liu, C.-C. Yeh, P.-L. Liu, C.-K. Tung, C.-H. Cheng,A Robust Data Retention Characteristic of Sol-gel Derived Nanocrystal Memory by Hot Hole Trapping,IEEE Electron Device Letters,31,pp746-748 (SCI)
| 學年度 | 2010 |
|---|---|
| 期刊等級 | SCI |
| 論文名稱(篇名) | A Robust Data Retention Characteristic of Sol-gel Derived Nanocrystal Memory by Hot Hole Trapping |
| 期刊名 | IEEE Electron Device Letters |
| 卷數 | 31 |
| 起頁 | 746 |
| 迄頁 | 748 |
| 全部作者 | C.-C. Wu, F.-H. Ko, W.-L. Yang, H.-C. You, F.-K. Liu, C.-C. Yeh, P.-L. Liu, C.-K. Tung, C.-H. Cheng |
| 使用語言 | 英文 |
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